Trade Mark Journal No.2025/025 20 June 2025

UK00004211200 29 May 2025 (9)

GAIA

International priority date claimed: 27 May 2025 (United States of America) (99204250)

Class 9: Imaging metrology tools, namely, scientific and electronic imaging instruments for inspecting and characterizing physical properties, including micro-bump arrays, of semiconductors, integrated circuits, and microelectronics, and their packaging; Computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, and microelectronics; Optical inspection apparatus for inspection of semiconductor materials, namely, semiconductor wafers, semiconductor panels, and their packaging; Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers, semiconductor panels, and their packaging.

KLA Corporation

Representative: Fieldfisher LLP