Trade Mark Journal No.2025/047 21 November 2025

WO0000001885858 (9,37,42)

Office of origin: Benelux Office for Intellectual Property (BOIP)

Date of International Registration:11 September 2025
Date of designation in the UK: 11 September 2025
Image for mark 1885858_TIF SKYSCAN

Class 9
Testing apparatus using electron beam for inspection of semiconductor materials, devices and products.
Class 37
Maintenance of semiconductor inspection tools.
Class 42
Technological supervision and inspection in the field of quality control of semiconductor wafers and reticles.

ASML Netherlands B.V.

Representative: Marqu Brands and Trademarks B.V., Koninginnegracht 35, NL-2514 AC Den Haag, NETHERLANDS