Trade Mark Journal No.2026/007 13 February 2026

WO0000001899315 (9)

Office of origin: Japan

Date of International Registration:18 December 2025
Date of designation in the UK: 18 December 2025
Image for mark 1899315_TIF XHENA

International priority date claimed: 27 November 2025 (Japan)
Class 9
Laboratory apparatus and instruments; measuring apparatus and instruments; testing apparatus not for medical purposes; semiconductor testing apparatus; industrial X-ray apparatus; X-ray apparatus not for medical purposes; X-ray diffraction apparatus not for medical use; X-ray fluorescence analyzers.

Rigaku Corporation

Representative: Sakai International Patent Office, Toranomon Daibiru-East Building,, 8-1, Kasumigaseki 3-Chome,, Chiyoda-ku, Tokyo 100-0013, JAPAN