# Trade Mark Journal No.2026/025 19 June 2026

## WO0000001909697 (9,42)

Office of origin: European Union Intellectual Property Office (EUIPO)

Date of International Registration:5 January 2026
Date of designation in the UK: 5 January 2026

International priority date claimed: 9 July 2025 (European Union Intellectual Property Office (EUIPO)) (019215559)

Class 9
  Computer programmes for data processing; data processing systems; imaging apparatus, namely electron microscopes, apparatus and instruments for scanning ION microscopy, focused ion-beam devices and industrial X-ray machines and apparatus [not for medical use]; electronic logic circuits; microchips [computer hardware]; data collection apparatus; data storage devices; laboratory apparatus and instruments, namely electron microscopes, apparatus and instruments for scanning ION microscopy, focused ion-beam devices and industrial X-ray machines and apparatus [not for medical use]; tomographic instruments, other than for medical use; electron microscopes.
Class 42
  Technological research in the following fields: electron microscopes, apparatus and instruments for scanning ION microscopy, focused ion beam devices, industrial X-ray machines and apparatus not for medical purposes; research and development in the field of laboratory apparatus and instruments, namely in relation to the following goods: electron microscopes, apparatus and instruments for scanning ION microscopy, focused ion-beam devices, industrial X-ray machines and apparatus not for medical purposes; research and development on imaging technology for scientific instruments, namely in the following fields: electron microscopes, apparatus and instruments for scanning ION microscopy, focused ion-beam devices, industrial X-ray machines and apparatus not for medical purposes and computed tomography; research, development, design and upgrading of computer software in the following fields: electron microscopy, ION mircoscopy, focused ion-beam microscopy, industrial X-ray technology and computed tomography; programming of data processing equipment in the following fields: electron microscopy, ION mircoscopy, focused ion-beam microscopy, industrial X-ray technology and computed tomography; software engineering services for data processing programs in the following fields: electron microscopy, ION mircoscopy, focused ion-beam microscopy, industrial X-ray technology and computed tomography; rental of scientific microscopes; design of optical and microoptical components in the following fields: electron microscopy, ION mircoscopy, focused ion beam microscopy, industrial X-ray technology and computed tomography.

TESCAN GROUP, a.s.

Representative: HARBER IP S.R.O., Dukelských hrdinů 567/52, CZ-170 00 Prague 7 - Holešovice, CZECHIA